Program

Day 1 – March 21, 2017 – Boston, MA

08:00 – 08:45 Breakfast and Registration

08:45 – 09:00 Welcome Remarks: SELSE General and Program Chairs

09:00 – 10:00 Session I: Keynote Speech (Chair: Paolo Rech)

Tolerating Hardware Faults in Commodity Software:

Problems, Solutions and a Roadmap

Prof. Karthik Pattabiraman

10:00 – 10:30 Coffee Break

10:30 – 11:45 Session II: Characterization Studies (Chair: Kapil Arya)

 

  • A System-Level Voltage/Frequency Scaling Characterization Framework for Multicore CPUs
  • System Call Logs with Natural Random Faults: Experimental Design and Application
  • Characterizing The Impact of Soft Errors Across Microarchitectural Structures and Implications for Predictability

 

11:45 – 13:00 Lunch

13:00 – 14:15 Session III: Application Resilience (Chair: John Daly)

 

  • Evaluation and Mitigation of Neural Network-based Object Detection in Three GPU Architectures
  • Evaluating the Effects of Input Parameters on Program Vulnerability in GPU Applications
  • Exploiting the Tradeoff between Program Accuracy and Soft-error Resiliency Overhead for Machine Learning Workloads

14:15 – 15:15 Session IV: Keynote Speech (Chair: Mattan Erez)

Approximate Computing: It’s not just good, it’s good enough!

Prof. Michael Carbin

15:15 – 16:45 Session V: Poster Session (Chair: Alan Wood) and Coffee Break

 

  • Soft Error Hardened Flip-Flop Based on a Novel Bulk Potential Management Technique
  • Reliability Analysis of Feed-Forward Artificial Neural Networks in System on Chips
  • Adapting the DMTCP Plugin Model for Checkpointing of Hardware Emulation
  • Temperature Dependence of SER Performance in 14nm FinFET Technology
  • Deep Healing: Ease the BTI and EM Wearout Crisis by Activating Recovery
  • Exploiting the Tradeoff between Program Accuracy and Soft-error Resiliency Overhead for Machine Learning Workloads

 

 

16:45 – 17:30 SELSE Business Meeting

18:00              Reception and Banquet

Day 2 – March 22, 2017 – Boston, MA

08:00 – 08:30 Breakfast

08:30 – 09:30 Session VI: Keynote  (Chair: David Kaeli)

Memory Errors in Modern Systems

Dr. Vilas Sridharan, AMD

09:30 – 10:00 Coffee Break

10:00 – 11:15 Session VII: Evaluation Tools (Chair: Paolo Rech)

 

  • Preliminary Results of ChipIr; a new Atmospheric-like Neutron Beamline for the Irradiation of Microelectronics
  • A Fine-grained; Accountable; Flexible; and Efficient Soft Error Fault Injection Framework for Profiling Application Vulnerability
  • Software Marking for Cross-Layer Architectural Vulnerability Estimation Model

11:15 – 12:15 Session VIII: Panel Discussion (Chair: Dan Alexandrescu)

Topic: Beam Experiments: Industry, Academia, and Facility Experiences

Panelists: Vilas Sridharan, Carlo Cazzaniga, Ethan Cascio, Siva Hari, Paolo Rech

12:00 – 13:30 Lunch

13:30 – 14:55 Session IX: Process Variability and Aging (Chair: Siva Hari)

 

  • DRAM Scaling Error Evaluation Model with Variable Retention Time
  • Deep Healing: Ease the BTI and EM Wearout Crisis by Activating Recovery
  • ASAR: Application-Specific Approximate Recovery to Mitigate Hardware Variability

15:00 – 16:00 Session X: Random Access (Chair: TBD)

16:00 Closing Remarks