SELSE 6
Day 1 - March 23rd, 2010 - Stanford University
8:00-8:45 Continental
Breakfast and Registration
Chair: Charles Recchia (Intel)
John Daly (Center for Exceptional
Computing).
Chair: Rakesh Kumar (University of Illinois)
Invited Talk : CMOS Process
Variations
– Critical Operating Point Hypothesis.
Janak
Patel (
Chair: Helmut Puchner (Cypress)
Steve
Wender, (
15:00-15:15 Break
15:15-16:45 Session IV: SER Measurement 2
Chair: Vinod Ambrose (Intel)
Seth
Prejean.
16:45-17:00
Break
17:00-18:00
Panel: Relating
Measured Soft Error
Measurements to Predicted Behaviours
18:00
Reception and Dinner
SELSE 6
Day 2 - March 24th, 2010 - Stanford University
8:30-10:45 Session
V: Circuit Level Modeling and Measurement
Chair: Steve Walstra (Intel)
Invited Talk : Modeling and
Analysis of SER In
Combinatorial Circuits
Natasa Miskov-Zivanov, Carnegie Mellon
Unversity.
Design of a Sequential
Logic Cell Using LEAP: Layout Design Through Error Aware Placement
On the Radiation-Induced Soft Error
Performance of Hardened
Sequential Elements in Advanced Bulk CMOS Technologies.
10:45-11:00 Break
11:00-12:00
Session VI:
Microprocessors III
Chair: Ishwar Parulkar (Cisco Systems)
Logic
Soft Errors in a Parallel CISC Decoder
12:00-13:00
Lunch
13:00-14:00 Poster
Session
Resil: A Resiliency Hardware/Software
Framework for ASIPs.
Concurrent Autonomous Self-Test for
Uncore
Components in SoCs.
Reliability-Aware Synthesis: XOR
Logic Function
Case Study.
The Effect of Pipeline Depth on Logic
Soft Errors.
A Bulk Current Sensor to Detect
Single-Event Transients
Tao
Wang, Zhichao Zhang, Li Chen, Anh Dinh, and Robert Shuler.
14:00-15:00 Session
VII: Mitigation Techniques
Chair: Adrian Evans (Cisco Systems)
A Numerical
Optimization-based Methodology for
Application Robustification.
On-Line
Detection and Correction of Errors Due to
Fast, Dynamic Voltage Droop Events.
15:00-15:15 Break
15:15-16:00 Session
VIII: Cross Layer Reliability
Chair: Subhashish Mitra (Stanford University)
Invited Talk : Cross-Layer
Reliability.
Nick Carter (Intel).
16:00-16:30 Discussion:
Cross-Layer Reliability.
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